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Simulation code for “On the Impact of Phase Errors in Phase-Dependent Amplitudes of Near-Field RISs,” by K. Wang, C-T. Lam, and B.K. Ng, et al, IEEE TVT, 2025, doi: 10.1109/TVT.2025.3647594.

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ken0225/On-Impact-PEs-PDAs-NF-RISs

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IMPORTANT: If you use any code in this repository for research that results in a publication, please cite the original article listed above. I also recommend explicitly stating in your manuscript that you used this code package, both to help disseminate it and to avoid any potential concerns about plagiarism during peer review. This code package is licensed under the GPLv2. Under this license, if you download and run the code on your computer, you acknowledge that you assume responsibility for it; therefore, I will not provide support or answer questions about the code. In addition, if your research or publication incorporates this code, you are required to release your related work as open source in accordance with the GPLv2.

On-Impact-PEs-PDAs-NF-RISs

This code package is related to the following scientific article:

K. Wang*, C. -T. Lam, B. K. Ng, and Yue Liu, "On the Impact of Phase Errors in Phase-Dependent Amplitudes of Near-Field RISs," in IEEE Transactions on Vehicular Technology, 2025, doi: 10.1109/TVT.2025.3647594.

You can download this via Baidu Netdisk, Gitee, and Google Drive.

This paper can also be found on arXiv here.

How to use these files?

  • Code_TVT25_Ken.zip: Contains the MATLAB source code required to reproduce the simulation results.
  • TeX_TVT25_Ken.zip: Includes the LaTeX source files, fully compatible with Overleaf.
  • On-Impact-PEs-PDAs-NF-RISs.pdf: The final manuscript in PDF format.
  • Response_TVT25.pdf: The detailed response to the reviewers' comments in PDF format.
  • As an illustration, Fig_3a.m generates Fig. 3(a) of the paper. All other figures can be reproduced using the code provided in Code_TVT25_Ken.zip.

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Simulation code for “On the Impact of Phase Errors in Phase-Dependent Amplitudes of Near-Field RISs,” by K. Wang, C-T. Lam, and B.K. Ng, et al, IEEE TVT, 2025, doi: 10.1109/TVT.2025.3647594.

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