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Introduce new test classes for BigEndianConverter and LittleEndianConverter, including a shared base test suite for round-trip conversions, boundary values, and offset-based reads. Add cross-endian tests to verify byte order and compatibility. Improves test coverage and reliability for all supported primitive types. No changes to library code.
Added ForEach<T> extension method for IEnumerable<T> to apply an action to each element. Enhanced XML documentation for RemoveLastEquals<T> to clarify its behavior and usage. Updated using directives to include System and System.Linq.
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Introduce new test classes for BigEndianConverter and LittleEndianConverter, including a shared base test suite for round-trip conversions, boundary values, and offset-based reads. Add cross-endian tests to verify byte order and compatibility. Improves test coverage and reliability for all supported primitive types. No changes to library code.